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Cross sectional observation of the earth

Toshie Yaguchi, Yasushi Kuroda, Takeo Kamino (Hitachi Science Systems, Ltd.)

Takahito Hashimoto (Instrument Division, Hitachi, Ltd.)

Masato Nakatsuka (Head office, Tohoku University), Kazuyuki Tohji (Tohoku University)

The front picture shows SEM image of a stratified particle of Fe with TiO₂ and SiO₂ layers. The picture behind the SEM image shows STEM image of the particle after preparing transparent specimen by FIB technique. The cross sectional view demonstrate fine structures for the Fe particle and the layers of SiO₂(20 nm), TiO₂(40nm),SiO₂(40 nm) and TiO₂(20 nm).
At 56th photo contest hosted by the Japanese Society of Electron Microscopy in 2000.

Specimen : Multistratified particle
Instrument : Ultra thin film evaluation system HD-2000
Accelerating voltage : 200kV

Specimen : Courtesy of Professor Masato Nakatsuka (Head Office, Tohoku University), Kazuyuki Tohji (Tohoku University)

Part of information related to these photographers is based on the information when the photo was taken.
This work was presented at the "photo contest" hosted by the Japanese Society of Microscopy.
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