nanoart : Hitachi High-Technologies Corporation

Star Crest

Toshie Yaguchi, Takahiro Sato, Takeo Kamino (Hitachi Science Systems, Ltd.)

Hisafumi Ohtsuka (Hitachi High-Technologies corporation)

This is a Large Angle Convergent Beam Electron Diffraction (LACBED) pattern observed along Si (111) zone axis. Convergent electron beam produces such beautiful geometrical patterns formed by perfect atomic arrangement. Could you call it a "CREST of material"?
At 58th photo contest hosted by the Japanese Society of Electron Microscopy in 2002.

Specimen : Si single crystal
Instrument : Transmission Electron Microscope H-9000NAR
Accelerating voltage : 200 kV

All information related to these photographers is based on the information when the photo was taken.
This work was presented at the "photo contest" hosted by the Japanese Society of Microscopy.
Reproduction or republication without permission prohibited.
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