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SEM (Scanning Electron Microscope) |
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Scanning Electron Microscope S-3700N |
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The Analytical SEM for Studying Large, Heavy & Tall Samples.
- Large sample up to 300mm in diameter
- Observable area up to 203mm in diameter
- Observation and EDS analysis on a sample up to 110mm tall
- Versatile port layout for various analytical applications
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Scanning Electron Microscope S-3400N |
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A yet more user-friendly SEM through newly developed electron optics and Automatic functions.
- Revolutionary automatic axis-alignment functions
(Auto Beam Setting, Auto Axial Alignment, etc.)
- Even better resolution of 10nm at 3kV
- Saving floor space and electric power consumption due to TMP evacuation system
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Scanning Electron Microscope SU-1500
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Compact & High-performance
- 20 % Reduction in Footprint Compared to the Current Model
- VP Mode Standard
- SE 3.0 nm Resolution at 30 kV, BSE 4.0 nm (6 Pa) Guaranteed
- Accommodates Samples up to 152 mm (diameter) and 60 mm (height)
- Provides for Two EDX Symmetrical Ports
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Products & Service | Customer Service |
