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SEM (Scanning Electron Microscope)

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Scanning Electron Microscope SU3500

 
Scanning Electron Microscope S-3700N A New Dimension in Image Quality.
  • Large sample up to 300mm in diameter
  • Observable area up to 203mm in diameter
  • Observation and EDS analysis on a sample up to 110mm tall
  • Versatile port layout for various analytical applications

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Scanning Electron Microscope S-3700N

 
Scanning Electron Microscope S-3700N The Analytical SEM for Studying Large, Heavy & Tall Samples.
  • Even better resolution SE 7nm at 3kV, BSE 10nm at 5kV
  • New Gun Bias System and Image Signal Processing allows quick and easy focus adjustment and astigmatism correction
  • High speed Automatic Focus Control (AFC) and Auto Brightness & Contrast Control (ABCC) function enable faster and optimized image observation

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Scanning Electron Microscope S-3400N

 
Scanning Electron Microscope S-3400N A yet more user-friendly SEM through newly developed electron optics and Automatic functions.
  • Revolutionary automatic axis-alignment functions
    (Auto Beam Setting, Auto Axial Alignment, etc.)
  • Even better resolution of 10nm at 3kV
  • Saving floor space and electric power consumption due to TMP evacuation system.

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Scanning Electron Microscope SU1510

 
Scanning Electron Microscope SU1510 Compact & High-performance
  • 20 % Reduction in Footprint Compared to the Current Model
  • VP Mode Standard
  • SE 3.0 nm Resolution at 30 kV, BSE 4.0 nm (6 Pa) Guaranteed
  • Accommodates Samples up to 153 mm (diameter) and 60 mm (height)
  • Saving floor space and electric power consumption due to TMP evacuation system.

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