(S)TEM (Transmission Electron Microscope) : Hitachi High-Technologies Corporation

Field Emission Transmission Electron Microscope HF-3300

Combination of high reputation Hitachi cold field emission electron source and 300 kV accelerating voltage realizes both ultrahigh resolution imaging and high sensitivity analysis. Spatially resolved EELS and high precision parallel nanobeam electron beam diffraction open a new avenue for efficient and high precision material analysis.

Resolution:
0.1 nm (crystal lattice)
0.19 nm (point to point)
0.13 nm (information limit)
Magnification: X 200 to X 1,500,000
Accelerating voltage: 300 kV, 200 kV (*), 100 kV (*)

(*) Optional accessory

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Transmission Electron Microscope H-9500

High-throughput high-resolution electron microscopy.

Advanced digital user-friendly atomic resolution microscope
Integrated computer control with digital cameras allows various image processing functions
Hitachi's field proven high voltage technology allows for a quick automated startup of the entire system
Stable 5-Axis Hiper stage features automatic navigation and sample position trace capabilities

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Spherical Aberration Corrected Scanning Transmission Electron Microscope HD-2700

The dedicated scanning transmission microscope (STEM) HD-2700, equipped with spherical aberration corrector co-developed by CEOS GmbH (Germany, managing director: Dr. Max Haider), enables dramatically expanded STEM performance suitable for advanced nano-technology research. Due to the correction of spherical aberration which has limited the performance of electron microscope, approximately 1.5 times higher resolution and 10 times higher probe current than the standard model are achieved simultaneously.

Image resolution:
0.136nm (w/ HR-lens(*))
0.144nm (w/ Std. lens)
0.204nm (w/o Cs-corrector)
Magnification: x 100-10,000,000
Accelerating voltage: 200kV, 120kV(*)
EDX(*) solid angle: 0.3sr. or more, Take-off angle:24° degree.

(*)

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Transmission Electron Microscope HT7700

The HT7700 was designed with groundbreaking features, chief among these are a superior level of operability and an extensive range of useful digital imaging functions. These features ensure usability across the broadest possible range of applications fields, from the main application area of biomedicine to nanotechnology and soft carbon-based materials. Furthermore, the decision to integrate a high-resolution digital camera and microscope operation has made possible a simplified system control with one monitor, allowing sample observation even under ordinary room lights.

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