(S)TEM (Transmission Electron Microscope) : Hitachi High-Technologies Corporation

Field Emission Transmission Electron Microscope HF-3300

Combination of high reputation Hitachi cold field emission electron source and 300 kV accelerating voltage realizes both ultrahigh resolution imaging and high sensitivity analysis. Double bi-prism holography, spatially resolved EELS and high precision parallel nanobeam electron beam diffraction open a new avenue for efficient and high precision material analysis.

Resolution:
0.1 nm (crystal lattice)
0.19 nm (point to point)
0.13 nm (information limit)
Magnification: X 200 to X 1,500,000
Accelerating voltage: 300 kV, 200 k V ^(*1), 100 kV ^(*1)

^(*1) Optional accessory

Transmission Electron Microscope H-9500

High-throughput high-resolution electron microscopy.

Advanced digital user-friendly atomic resolution microscope
Integrated computer control with digital cameras allows various image processing functions
Hitachi's field proven high voltage technology allows for a quick automated startup of the entire system
Stable 5-Axis Hiper stage features automatic navigation and sample position trace capabilities

Spherical Aberration Corrected Scanning Transmission Electron Microscope HD-2700

The dedicated scanning transmission microscope (STEM) HD-2700, equipped with spherical aberration corrector co-developed by CEOS GmbH (Germany, managing director: Dr. Max Haider), enables dramatically expanded STEM performance suitable for advanced nano-technology research. Due to the correction of spherical aberration which has limited the performance of electron microscope, approximately 1.5 times higher resolution and 10 times higher probe current than the standard model are achieved simultaneously.

Scanning Transmission Electron Microscope HD-2300A

The HD-2300A is the third-generation 200kV dedicated scanning transmission microscope (STEM), which allows TEM level precise characterization combined with user-friendly features.
Shottky or cold FE is selected as an electron gun. The automated alignment functions simplify beam alignment, focusing and astigmatism correction. Highly-sensitive energy-dispersive X-ray analysis and real time elemental mapping by the EELS (electron energy loss spectroscopy) system (ELV series) are available as optional attachments. The other option, live diffraction camera, provides simultaneous viewing of the image and nano diffraction pattern.

Transmission Electron Microscope H-7650

The H-7650 is a high performance digital imaging TEM featuring a fully integrated high sensitivity digital camera mounted below the film camera chamber. This allows direct imaging at beam dose rates that would be insufficient to excite a traditional fluorescent screen imaging system, ensuring that there is the minimum of beam damage to sensitive samples. The H-7650 features single computer operation and a single display monitor. A comprehensive image processing and image data management system is also provided.