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(S)TEM (Transmission Electron Microscope) |
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Field Emission Transmission Electron Microscope HF-3300 |
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Combination of high reputation Hitachi cold field emission electron source and 300 kV accelerating voltage realizes both ultrahigh resolution imaging and high sensitivity analysis. Double bi-prism holography, spatially resolved EELS and high precision parallel nanobeam electron beam diffraction open a new avenue for efficient and high precision material analysis.
- Resolution:
0.1 nm (crystal lattice)
0.19 nm (point to point)
0.13 nm (information limit)
- Magnification: X 200 to X 1,500,000
- Accelerating voltage: 300 kV, 200 k V (*), 100 kV (*)
(*) Optional accessory
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Transmission Electron Microscope H-9500 |
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High-throughput high-resolution electron microscopy.
- Advanced digital user-friendly atomic resolution microscope
- Integrated computer control with digital cameras allows various image processing functions
- Hitachi's field proven high voltage technology allows for a quick automated startup of the entire system
- Stable 5-Axis Hiper stage features automatic navigation and sample position trace capabilities
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Transmission Electron Microscope H-7650 |
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The H-7650 is a high performance digital imaging TEM featuring a fully integrated high sensitivity digital camera mounted below the film camera chamber. This allows direct imaging at beam dose rates that would be insufficient to excite a traditional fluorescent screen imaging system, ensuring that there is the minimum of beam damage to sensitive samples. The H-7650 features single computer operation and a single display monitor. A comprehensive image processing and image data management system is also provided.
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