U-4100 UV-Visible-NIR Spectrophotometer Large sample measurement system

The large sample measurement system, adopting an optical system designed to collect sufficient spectrum energy in the whole measurable wavelength range , makes it possible to measure transmittance and reflectivity and is the best choice for measuring a large sample that is hard to place in the specimen chamber of a solid sample measurement system. Transmittance and reflectivity of a large glass item, a silicon wafer which is a material used for optics and electronics, or a liquid crystal substrate, can be measured non-destructively without cutting the sample. The integrating sphere built-in in the detector section allows obtaining highly accurate data from a solid sample. Combination with a wide array of special accessories such as a regular reflector meets various analytical needs.

System configuration Monochromator Prism-grating Sample compartment Large size Detector Standard integrating sphere Measuring wavelength range 240 to 2,600nm Sample size Max. 430 ×430mm

U-4100 Overview  Specifications  System lineup  Applications  UV-Vis/NIR Spectrophotometer Basic Course  Contact Us

Specifications

Item Specifications 5°specular reflectance accessory (relative) Relative reflectivity at an incident angle of 5°can be measured for a standard sample. Vertical 5°specular reflectance accessory (relative) Relative reflectivity at an incident angle of 5°can be measured for a standard sample. Compared with a 5° regular reflector (relativity), a large sample or a sample difficult to fix because of its shape can also be measured. 5°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 5° can be measured. Small 5°specular reflectance accessory (absolute) Using a holder, absolute reflectivity at an incident angle of 5° can be measured for a microscopic sample. 12°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 12° can be measured. (A polarizer and a polarizer holder are provided separately) 30°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 30° can be measured. (A polarizer and a polarizer holder are provided separately) 45°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 45° can be measured. (A polarizer and a polarizer holder are provided separately) Polarizer holder (holder alone) Needed when measuring reflectivity at an incident angle of 12° or more. (A polarizer is provided separately.) High-sensitivity integrating sphere accessory φ60 integrating sphere has an inner surface coated with Spectralon. Compared with a standard integrating sphere, the ultraviolet region can be measured with less noise. φ60 full-sphere integrating sphere accessory The integrating sphere is effective when light flux expands after passing through a sample, for example in the measurement of transmittance of a lens. Prism measurement unit Absolute reflectivity and transmittance can be measured at an incident angle of 45° for a cubic prism (16-60mm). Small prism measurement unit Absolute reflectivity can be measured at an incident angle of 45° for a micro-cubic prism (5-20mm). Variable angle reflectance accessory By moving the integrating sphere arbitrarily within incident angles of 20-60°, the absolute reflectivity of a sample can be measured. Variable angle absolute reflectance accessory (10° to 60°) Absolute reflectivity can be measured at incident angles of 10-60° for every 10°. Variable angle absolute reflectance accessory (15° to 65°) Absolute reflectivity can be measured at incident angles of 15-65° for every 10°. Variable angle reflectance accessory (relative) Relative reflectivity of a sample can be measured at an arbitrary incident angle (20-60°). Variable angle transmittance measurement accessory Transmittance can be measured at an arbitrary incident angle (0-60°) using a rotational stage. Lens transmittance measurement accessory Lens transmittance can be measured. Large lens transmittance measurement accessory The transmittance of a large lens can be measured with a V bench. Glass filter holder Transmittance and absorbance of a plate-like solid sample, like a glass filter, can be measured. Film holder A film-like sample can be measured.

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The above are examples of special accessories. They can be customized depending on the measured object or the application. Please contact us for further information.

System lineup

		Solid sample measurement system
	·	Large sample measurement system
		Ultraviolet region sample measurement system
		Liquid sample measurement system
		InGaAs System