U-4100 UV-Visible-NIR Spectrophotometer Solid sample measurement system

The solid sample measurement system utilizes an optical system designed to collect a sufficient amount of spectrum energy in the whole measurable wavelength range.It is a standard system which can measure transmittance and reflectivity. The detector section has a built-in integrating sphere which permits obtaining highly accurate data from a solid sample. Combination with a wide array of special accessories such as a regular reflector meets various analytical needs.

System configuration Monochromator Prism-grating Sample compartment Standard Detector Standard integrating sphere Measuring wavelength range 240 to 2,600nm Sample size Max. 200 ×200mm

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Specifications

Item Specifications 5°specular reflectance accessory (relative) Relative reflectivity at an incident angle of 5°can be measured for a standard sample. Vertical 5°specular reflectance accessory (relative) Relative reflectivity at an incident angle of 5°can be measured for a standard sample. Compared with a 5° regular reflector (relativity), a large sample or a sample difficult to fix because of its shape can also be measured. 5°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 5° can be measured. Small 5°specular reflectance accessory (absolute) Using a holder, absolute reflectivity at an incident angle of 5° can be measured for a microscopic sample. 12°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 12° can be measured. (A polarizer and a polarizer holder are provided separately) 30°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 30° can be measured. (A polarizer and a polarizer holder are provided separately) 45°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 45° can be measured. (A polarizer and a polarizer holder are provided separately) Polarizer holder (holder alone) Needed when measuring reflectivity at an incident angle of 12° or more. (A polarizer is provided separately.) High-sensitivity integrating sphere accessory φ60 integrating sphere has an inner surface coated with Spectralon. Compared with a standard integrating sphere, the ultraviolet region can be measured with less noise. φ60 full-sphere integrating sphere accessory The integrating sphere is effective when light flux expands after passing through a sample, for example in the measurement of transmittance of a lens. Prism measurement unit Absolute reflectivity and transmittance can be measured at an incident angle of 45° for a cubic prism (16-60mm). Small prism measurement unit Absolute reflectivity can be measured at an incident angle of 45° for a micro-cubic prism (5-20mm). Variable angle absolute reflectance accessory (10° to 60°) Absolute reflectivity can be measured at incident angles of 10-60° for every 10°. Variable angle absolute reflectance accessory (15° to 65°) Absolute reflectivity can be measured at incident angles of 15-65° for every 10°. Variable angle reflectance accessory (relative) Relative reflectivity of a sample can be measured at an arbitrary incident angle (20-60°). Variable angle transmittance measurement accessory Transmittance can be measured at an arbitrary incident angle (0-60°) using a rotational stage. Lens transmittance measurement accessory Lens transmittance can be measured. Large lens transmittance measurement accessory The transmittance of a large lens can be measured with a V bench. Glass filter holder Transmittance and absorbance of a plate-like solid sample, like a glass filter, can be measured. Film holder A film-like sample can be measured.

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The above are examples of special accessories. They can be customized depending on the measured object or the application. Please contact us for further information.

System lineup

	·	Solid sample measurement system
		Large sample measurement system
		Ultraviolet region sample measurement system
		Liquid sample measurement system
		InGaAs System