U-4100 UV-Visible-NIR Spectrophotometer Ultraviolet region sample measurement system

The ultraviolet region sample measurement system is a system in which optical components such as the light source, the spectrometer and the detector are designed for the ultraviolet region. Equipped with a grating that focuses diffracted light efficiently in the ultraviolet region and with a sensitive integrating sphere which can measure with low noise, the system obtains highly accurate data in the ultraviolet region. It is suitable for the measurement of components such as an excimer laser. Combination with a wide array of special accessories such as a regular reflector meets various analytical needs.

System configuration Monochromator Prism-grating Sample compartment Standard Detector High-sensitivity integrating sphere Measuring wavelength range 175 to 2,600nm Sample size Max. 200 ×200mm

U-4100 Overview  Specifications  System lineup  Applications  UV-Vis/NIR Spectrophotometer Basic Course  Contact Us

Specifications

Item Specifications 5°specular reflectance accessory (relative) Relative reflectivity at an incident angle of 5°can be measured for a standard sample. Vertical 5°specular reflectance accessory (relative) Relative reflectivity at an incident angle of 5°can be measured for a standard sample. Compared with a 5° regular reflector (relativity), a large sample or a sample difficult to fix because of its shape can also be measured. 5°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 5° can be measured. Small 5°specular reflectance accessory (absolute) Using a holder, absolute reflectivity at an incident angle of 5° can be measured for a microscopic sample. 12°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 12° can be measured. (A polarizer and a polarizer holder are provided separately) 30°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 30° can be measured. (A polarizer and a polarizer holder are provided separately) 45°specular reflectance accessory (absolute) Absolute reflectivity at an incident angle of 45° can be measured. (A polarizer and a polarizer holder are provided separately) Polarizer holder (holder alone) Needed when measuring reflectivity at an incident angle of 12° or more. (A polarizer is provided separately.) Rectangular 10mm cell holder Transmittance and absorbance of liquids can be measured with a 10mm square cell. Prism measurement unit Absolute reflectivity and transmittance can be measured at an incident angle of 45° for a cubic prism (16-60mm). Small prism measurement unit Absolute reflectivity can be measured at an incident angle of 45° for a micro-cubic prism (5-20mm). Variable angle absolute reflectance accessory (10° to 60°) Absolute reflectivity can be measured at incident angles of 10-60° for every 10°. Variable angle absolute reflectance accessory (15° to 65°) Absolute reflectivity can be measured at incident angles of 15-65° for every 10°. Variable angle reflectance accessory (relative) Relative reflectivity of a sample can be measured at an arbitrary incident angle (20-60°). Variable angle transmittance measurement accessory Transmittance can be measured at an arbitrary incident angle (0-60°) using a rotational stage. Lens transmittance measurement accessory Lens transmittance can be measured. Large lens transmittance measurement accessory The transmittance of a large lens can be measured with a V bench. Film holder A film-like sample can be measured.

*

The above are examples of special accessories. They can be customized depending on the measured object or the application. Please contact us for further information.

System lineup

		Solid sample measurement system
		Large sample measurement system
	·	Ultraviolet region sample measurement system
		Liquid sample measurement system
		InGaAs System